• 400 square meters ultra clean laboratory
  • Advanced 300mm semi-automatic machine for accurate die-measurement of DC, CV, 1/f noise, and RF testing
  • Electrical parameter test of MOS, BJT, Diode, Resistor, Inductor and other semiconductor devices
  • Support wafer level reliability testing such as EM, HCI, TDDB, NBTI, etc.
  • Supports testing from single Die to mainstream wafer sizes of 4, 6, 8, 12 inch, covering the measure equipment requirement for high frequency devices such as RF and millimeter waves.
  • Provide quality service for product development, design verification, production validation and customized measurement.