
RCExplorerTM
RCExplorer offers fast, in-design, pre-LVS and post-extraction parasitic analysis. This includes DSPF/SPEF-based pin-to-pin and point-to-point analyses. Also supported is interactive, layout-based point-to-point interconnect parasitic analysis.
Benefits
- Shortens design cycles using in-design, pre-LVS parasitic analysis
- Reduces post-extraction parasitic analysis from days to minutes
Highlights
- Interconnect analysis—batch and interactive modes
- DSPF/SPEF-based interconnect analysis and comparisons
- Pin-to-pin interconnect analysis—resistance, capacitance, and delay
- Layout based point-to-point resistance analysis
- Handles large RC networks like power mesh
- Interconnect calculator for RC estimation