WillSemi leverages Empyrean Polas® as its reliability analysis solution, ensuring a high level of robustness and reliability for discrete devices and power management ICs (PMICs).

"As design complexity continues to increase, power device design scenarios have become increasingly sophisticated. In addition to single-transistor structures, various stacked-transistor configurations have become an integral part of modern designs. 

Empyrean Polas® provides valuable guidance for RDS(on) and electromigration (EM) analysis of these complex structures. The tool presents RDS(on) results by net and layer, PAD current distribution for EM analysis, and comprehensive EM/IR-drop visualizations, helping engineers identify interconnect, PAD placement, and reliability issues.  It also helps reduce design redundancy while maintaining reliability and provides insights for layout optimization to achieve smaller die sizes."

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