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Transistor-level Power Integrity Analysis

Empyrean Patron

Moore’s Law and Post-Moore’s Law are driving the industry to integrate increasing number of transistors into shrinking chips. Space left for in-chip instances and connections becomes limited and precious. Along with the benefits of FinFET and GAAFET, challenges of electronic migration and IR-drop (EM/IR) are inevitable for design process and chip sign-off. 

Empyrean Patron® focuses on analog chip power integrity solution. IC designers can achieve comprehensive and reliable EM/IR data to sign-off the entire chip, with less learning cost and high efficiency.




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