Gate-Level and Transistor-Level Parasitic Extraction

Parasitic effects on circuit performance have become a major challenge in modern analog IC design. Empyrean RCExplorer™ supports both transistor-level and gate-level parasitic extraction, enabling designers to efficiently analyze parasitic effects, optimize circuit performance, and reduce the risk of costly design iterations.

Leveraging advanced technologies such as fast resistance network extraction, partial differential equation solving, and parasitic capacitance extraction, RCExplorer delivers fast and accurate parasitic extraction with both a high-accuracy 3D extraction mode and a high-speed 2.5D extraction mode.

The Empyrean RCExplorer™ solution helps designers achieve optimal performance and reliability.
 

Key Benefits:  Highly Accurate Parasitic RC Extraction
 High Accuracy – Built-in fast and accurate 3D field solver for high-precision RC calculation
 High Efficiency – Real-time layout reliability analysis provides convenient, fast, and accurate point-to-point RC analysis
 Seamless Integration – Fully integrated with Empyrean Aether™ LE and Empyrean Skipper^®, enabling a streamlined and efficient design-to-verification workflow